Tech billionaire Elon Musk failed to appear for a voluntary interview with Paris prosecutors on Monday. The summons relates to an ongoing investigation into his social media platform, X, and its Artificial Intelligence (AI) chatbot, Grok.
Prosecutors confirmed they took note of the absence of those summoned without explicitly naming the billionaire. This development follows a period of tension where Musk openly mocked French authorities on his platform.
Investigation targets election interference and deepfakes
The probe, which launched in January 2025, initially focused on allegations that the algorithm of X interfered in French politics. It has since expanded to cover the dissemination of Holocaust denial and sexual deepfakes generated by Grok.
In February, authorities searched the Paris offices of X, a move the company labeled as a “politicized” and “abusive” act. Musk has consistently maintained that the judicial actions are part of a broader political attack against free speech.
International watchdog raises alarm over Grok AI
A report by the Center for Countering Digital Hate (CCDH) revealed that Grok generated millions of sexualized images in just eleven days. These images reportedly included thousands of depictions that appeared to be children, sparked by simple text prompts.
Regulators in Britain and the European Union (EU) have also launched separate investigations into the platform. They are examining whether the company complied with personal data laws and protection standards for minors.
Legal proceedings to continue despite Musk absence
Paris prosecutors stated that the absence of those summoned will not stop the investigation from moving forward. They previously heard from several employees who were called to testify as witnesses regarding the platform’s management.
The legal team for X continues to deny any wrongdoing, insisting that the probe is “politically motivated.” However, the French government remains firm on holding tech managers accountable for criminal offenses occurring on their platforms.
